Hitachi High Technologies America (www.hitachi-hta.com) showcased its U-4100 UV-Vis-NIR Spectrophotometer.

The U-4100′s ability to accommodate large samples and vast array of optional system configurations makes it the ideal system for measuring optical materials used in solar cell manufacturing, such as Anti-Reflection Films, Substrates, Textured Glass and Distribution of Diffusion. Hitachi also offers Fluorescence Spectrophotometers capable of measuring fluorescence characteristics and quantum efficiency of photovoltaic materials.

The high performance and wide range of accessories available for the Hitachi U-4100 UV-Vis-NIR Spectrophotometer makes it the ideal tool for solar cell and thin wafer evaluations, offering superior high performance for the most demanding samples.

Original post by David Bae